Lock-in Thermography

Real-time lock-in thermography is an active measurement process for the non-destructive testing (NDT) of components. A heat pulse creates a sinus-shaped temperature field in the component. Analysing the heat flow allows conclusions about various types of concealed defects to be drawn.

The module for real-time lock-in systems improves the signal-noise ratio especially for weak or low-contrast signals. This increases the detection rate and optimizes the measurement results. Data flow evaluation (lock-in correlation) for each individual pixel runs parallel to data recording and is displayed in the image in real time.

Users can freely define the duration of lock-in measurement in a range between 1 second and several hours. Our software also enables you to control and synchronize external excitation sources.